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IEC Technical Specification 62876-2-1

IEC TS 62876-2-1:2018
Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test
IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.
BASE PUBLICATION
English
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Technical committee

TC 113 Nanotechnology for electrotechnical products and systems
Publication typeTechnical Specification
Publication date2018-08-29
Edition1.0
ICS

07.120

27.160

Stability date2027
ISBN number9782832259818
Pages30
File size1.25 MB
EditionDatePublicationEditionStatus
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